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101150-000
101150-000 -
SEMICONDUCTOR PROBE
声明:图片仅供参考,请以实物为准!
制造商:
Smiths Interconnect Americas, Inc.
Smiths Interconnect Americas, Inc.
制造商产品编号:
101150-000
仓库库存编号:
70009137
技术数据表:
Datasheet
订购热线:
400-900-3095 0755-21000796, QQ:
800152669
, Email:
sales@szcwdz.com
由于产品数据库庞大,部分产品信息可能未能及时更新,下单前请与销售人员确认好实时在库数量,谢谢合作!
101150-000产品概述
Semiconductor Probe, 5 A Current, 0.050 in. Pitch
1.1 Oz. spring
0.037 pF capacitance rating.
101150-000产品信息
Bandwidth
10 GHz @ -0.724 dB
Brand/Series
101150 Series
Capacitance
0.037 pF
Centerline, Spacing
0.026 (0.65) In.(mm) In.(mm)
Contact Resistance
70 Milliohms (Max.) Milliohms (Max.)
Current Rating
5 A A
Force, Spring
1.1 Oz. Oz.
Gender
Probe
Impedance
50 Ohms
Inductance
0.68 nH (Self) @ 0.050 in. Pitch
Length, Overall
0.138 In. In.
Material, Barrel
Phosphor Bronze
Material, Plating
Gold Plated (Plunger)
Material, Plunger
Phosphor Bronze
Material, Spring
Stainless Steel
Minimum Centers
0.026 In.
Primary Type
Probe
Temperature, Operating
-55 to +150 °C
Tip Style
Serrated/Chisel
Type
Semiconductor
关键词
101150-000相关搜索
Bandwidth 10 GHz @ -0.724 dB
Smiths Interconnect Americas, Inc. Bandwidth 10 GHz @ -0.724 dB
Spring Test Probes Bandwidth 10 GHz @ -0.724 dB
Smiths Interconnect Americas, Inc. Spring Test Probes Bandwidth 10 GHz @ -0.724 dB
Brand/Series 101150 Series
Smiths Interconnect Americas, Inc. Brand/Series 101150 Series
Spring Test Probes Brand/Series 101150 Series
Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 101150 Series
Capacitance 0.037 pF
Smiths Interconnect Americas, Inc. Capacitance 0.037 pF
Spring Test Probes Capacitance 0.037 pF
Smiths Interconnect Americas, Inc. Spring Test Probes Capacitance 0.037 pF
Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Smiths Interconnect Americas, Inc. Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Smiths Interconnect Americas, Inc. Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Current Rating 5 A A
Smiths Interconnect Americas, Inc. Current Rating 5 A A
Spring Test Probes Current Rating 5 A A
Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 5 A A
Force, Spring 1.1 Oz. Oz.
Smiths Interconnect Americas, Inc. Force, Spring 1.1 Oz. Oz.
Spring Test Probes Force, Spring 1.1 Oz. Oz.
Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 1.1 Oz. Oz.
Gender Probe
Smiths Interconnect Americas, Inc. Gender Probe
Spring Test Probes Gender Probe
Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe
Impedance 50 Ohms
Smiths Interconnect Americas, Inc. Impedance 50 Ohms
Spring Test Probes Impedance 50 Ohms
Smiths Interconnect Americas, Inc. Spring Test Probes Impedance 50 Ohms
Inductance 0.68 nH (Self) @ 0.050 in. Pitch
Smiths Interconnect Americas, Inc. Inductance 0.68 nH (Self) @ 0.050 in. Pitch
Spring Test Probes Inductance 0.68 nH (Self) @ 0.050 in. Pitch
Smiths Interconnect Americas, Inc. Spring Test Probes Inductance 0.68 nH (Self) @ 0.050 in. Pitch
Length, Overall 0.138 In. In.
Smiths Interconnect Americas, Inc. Length, Overall 0.138 In. In.
Spring Test Probes Length, Overall 0.138 In. In.
Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.138 In. In.
Material, Barrel Phosphor Bronze
Smiths Interconnect Americas, Inc. Material, Barrel Phosphor Bronze
Spring Test Probes Material, Barrel Phosphor Bronze
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Phosphor Bronze
Material, Plating Gold Plated (Plunger)
Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)
Spring Test Probes Material, Plating Gold Plated (Plunger)
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)
Material, Plunger Phosphor Bronze
Smiths Interconnect Americas, Inc. Material, Plunger Phosphor Bronze
Spring Test Probes Material, Plunger Phosphor Bronze
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Phosphor Bronze
Material, Spring Stainless Steel
Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel
Spring Test Probes Material, Spring Stainless Steel
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel
Minimum Centers 0.026 In.
Smiths Interconnect Americas, Inc. Minimum Centers 0.026 In.
Spring Test Probes Minimum Centers 0.026 In.
Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.026 In.
Primary Type Probe
Smiths Interconnect Americas, Inc. Primary Type Probe
Spring Test Probes Primary Type Probe
Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe
Temperature, Operating -55 to +150 °C
Smiths Interconnect Americas, Inc. Temperature, Operating -55 to +150 °C
Spring Test Probes Temperature, Operating -55 to +150 °C
Smiths Interconnect Americas, Inc. Spring Test Probes Temperature, Operating -55 to +150 °C
Tip Style Serrated/Chisel
Smiths Interconnect Americas, Inc. Tip Style Serrated/Chisel
Spring Test Probes Tip Style Serrated/Chisel
Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Serrated/Chisel
Type Semiconductor
Smiths Interconnect Americas, Inc. Type Semiconductor
Spring Test Probes Type Semiconductor
Smiths Interconnect Americas, Inc. Spring Test Probes Type Semiconductor
邮箱:
sales@szcwdz.com
Q Q:
800152669
手机网站:
m.szcwdz.com
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