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S-0-B-2.2-G - 

0.050 INCH CENTERLINE SPACING SPRING CONTACT PROBE 30 DEGREE CUP TIP

Smiths Interconnect Americas, Inc. S-0-B-2.2-G
声明：图片仅供参考，请以实物为准！
制造商产品编号：
S-0-B-2.2-G
仓库库存编号：
70009066
技术数据表：
View S-0-B-2.2-G Datasheet Datasheet
订购热线： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大，部分产品信息可能未能及时更新，下单前请与销售人员确认好实时在库数量，谢谢合作！

S-0-B-2.2-G产品概述

Single Ended Non-Rotating Coax Probes, 3 A Continuous Current Rating
  • Minimum center 0.050 "
  • Maximum travel 0.1 "
    Probe with gold plated plunger material.

    • S-0-B-2.2-G产品信息

      Brand/Series  S-0 Series  
      Centerline, Spacing  0.050 (1.27) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Diameter, Mounting Hole  0.021 in.  
      Force, Spring  2.2 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.66 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.1 In.  
      Minimum Centers  0.05 In.  
      Primary Type  Probe  
      Size  Size 0  
      Tip Style  B - Spear 30 Deg  
      Type  General Purpose  
      Working Travel  0.07  
    关键词         

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    S-0-B-2.2-G相关搜索

    Brand/Series S-0 Series  Smiths Interconnect Americas, Inc. Brand/Series S-0 Series  Spring Test Probes Brand/Series S-0 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-0 Series   Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Diameter, Mounting Hole 0.021 in.  Smiths Interconnect Americas, Inc. Diameter, Mounting Hole 0.021 in.  Spring Test Probes Diameter, Mounting Hole 0.021 in.  Smiths Interconnect Americas, Inc. Spring Test Probes Diameter, Mounting Hole 0.021 in.   Force, Spring 2.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 2.2 Oz. Oz.  Spring Test Probes Force, Spring 2.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 2.2 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.66 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.66 In. In.  Spring Test Probes Length, Overall 0.66 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.66 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.1 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.1 In.  Spring Test Probes Maximum Travel 0.1 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.1 In.   Minimum Centers 0.05 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.05 In.  Spring Test Probes Minimum Centers 0.05 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.05 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 0  Smiths Interconnect Americas, Inc. Size Size 0  Spring Test Probes Size Size 0  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 0   Tip Style B - Spear 30 Deg  Smiths Interconnect Americas, Inc. Tip Style B - Spear 30 Deg  Spring Test Probes Tip Style B - Spear 30 Deg  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style B - Spear 30 Deg   Type General Purpose  Smiths Interconnect Americas, Inc. Type General Purpose  Spring Test Probes Type General Purpose  Smiths Interconnect Americas, Inc. Spring Test Probes Type General Purpose   Working Travel 0.07  Smiths Interconnect Americas, Inc. Working Travel 0.07  Spring Test Probes Working Travel 0.07  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.07  
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