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S-2-B-7-G - 

Spring Contact Probe .100 (size 2) centerline spacing 30 degree spear

Smiths Interconnect Americas, Inc. S-2-B-7-G
声明：图片仅供参考，请以实物为准！
制造商产品编号：
S-2-B-7-G
仓库库存编号：
70009184
技术数据表：
View S-2-B-7-G Datasheet Datasheet
订购热线： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大，部分产品信息可能未能及时更新，下单前请与销售人员确认好实时在库数量，谢谢合作！
  美国2号仓库    仓库直销，订单金额100元起订，满300元含运，满500元含税运，有单就有优惠，量大更优惠，支持原厂订货
型号 制造商 描述 实时库存 起订量 实时单价
(含税)		 货期
(工作日)		 操作
S-2-B-7-G
库存编号:818-S-2-B-7-G		 Smiths Interconnect Contact Probes SHARP POINTED HEAD3486
1起订		1+
10+
100+
500+
1000+
5000+
￥23.05
￥21.28
￥17.97
￥17.85
￥17.73
￥13.83
6-10天购买 购买
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S-2-B-7-G产品概述

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.
  • Tip Style: Spear Tip
  • Maximum Travel: 0.160 (4.06) In.(mm)
  • Spring Force: 7.0 Oz. @ 0.100 (2.54) In.(mm)

    • S-2-B-7-G产品信息

      Brand/Series  S-2 Series  
      Centerline, Spacing  0.100 (2.54) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Force, Spring  7.0 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.970 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.160 In.  
      Minimum Centers  0.100 In.  
      Primary Type  Probe  
      Size  Size 2  
      Tip Style  B - Spear 30 Deg  
      Type  Connector Probe  
      Working Travel  0.10  
    关键词         

    S-2-B-7-G关联产品

    • 参考图片
    • 制造商 / 说明 / 型号 / 仓库库存编号
    • PDF
    • 操作

    S-2-B-7-G客户还搜索了

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    • PDF
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    S-2-B-7-G相关搜索

    Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Brand/Series S-2 Series  Spring Test Probes Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-2 Series   Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 7.0 Oz. Oz.  Spring Test Probes Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 7.0 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.970 In. In.  Spring Test Probes Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.970 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.160 In.  Spring Test Probes Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.160 In.   Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.100 In.  Spring Test Probes Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.100 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 2  Smiths Interconnect Americas, Inc. Size Size 2  Spring Test Probes Size Size 2  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 2   Tip Style B - Spear 30 Deg  Smiths Interconnect Americas, Inc. Tip Style B - Spear 30 Deg  Spring Test Probes Tip Style B - Spear 30 Deg  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style B - Spear 30 Deg   Type Connector Probe  Smiths Interconnect Americas, Inc. Type Connector Probe  Spring Test Probes Type Connector Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Type Connector Probe   Working Travel 0.10  Smiths Interconnect Americas, Inc. Working Travel 0.10  Spring Test Probes Working Travel 0.10  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.10  
    参考价格及参考库存
      美国2号仓库    仓库直销，订单金额100元起订，满300元含运，满500元含税运，有单就有优惠，量大更优惠，支持原厂订货
    型号 制造商 描述 操作
    S-2-B-7-G D/C
    [更多]    		 Smiths Interconnect

    Contact Probes SHARP POINTED HEAD

    RoHS: Compliant

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    参考图片 制造商 / 说明 / 型号 / 仓库库存编号 PDF 操作

    Smiths Interconnect Americas, Inc. - S-2-B-7-G - Spring Contact Probe .100 (size 2) centerline spacing 30 degree spear|70009184 | ChuangWei Electronics    		Smiths Interconnect Americas, Inc.
    Spring Contact Probe .100 (size 2) centerline spacing 30 degree spear

    型号：S-2-B-7-G
    仓库库存编号：70009184

    		搜索
      www.szcwdz.com    查看更多相关产品
    参考图片 型号/品牌 描述 / 技术参考 操作
    无图S-2-B-7-G
    INTERCONNECT DEVICES    		原厂原装货
    暂无PDF     		查价格库存
    查看详细
    无图S-2-B-7-G D/C
    IDI    		原厂原装货
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    制造商产品编号 仓库库存编号 制造商 / 说明 / 规格书 操作
    S-2-B-7-G
    INTERCONNECT DEVICES S-2-B-7-G    		1817218

    INTERCONNECT DEVICES

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