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S-2-X-7-G - 

4 pt, tapered crown test probe 7.0 force rated

Smiths Interconnect Americas, Inc. S-2-X-7-G
声明：图片仅供参考，请以实物为准！
制造商产品编号：
S-2-X-7-G
仓库库存编号：
70232524
技术数据表：
View S-2-X-7-G Datasheet Datasheet
订购热线： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于产品数据库庞大，部分产品信息可能未能及时更新，下单前请与销售人员确认好实时在库数量，谢谢合作！

S-2-X-7-G产品概述

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.
  • Tip Style: Tapered Crown
  • Maximum Travel: 0.160 (4.06) In.(mm)
  • Spring Force: 7.0 Oz. @ 0.100 (2.54) In.(mm)

    • S-2-X-7-G产品信息

      Brand/Series  S-2 Series  
      Centerline, Spacing  0.100 (2.54) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Force, Spring  7.0 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.970 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.160 In.  
      Minimum Centers  0.100 In.  
      Primary Type  Probe  
      Size  Size 2  
      Tip Style  X - Tapered Crown  
      Type  Connector Probe  
    关键词         

    S-2-X-7-G关联产品

    • 参考图片
    • 制造商 / 说明 / 型号 / 仓库库存编号
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    S-2-X-7-G相关搜索

    Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Brand/Series S-2 Series  Spring Test Probes Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-2 Series   Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 7.0 Oz. Oz.  Spring Test Probes Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 7.0 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.970 In. In.  Spring Test Probes Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.970 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.160 In.  Spring Test Probes Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.160 In.   Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.100 In.  Spring Test Probes Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.100 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 2  Smiths Interconnect Americas, Inc. Size Size 2  Spring Test Probes Size Size 2  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 2   Tip Style X - Tapered Crown  Smiths Interconnect Americas, Inc. Tip Style X - Tapered Crown  Spring Test Probes Tip Style X - Tapered Crown  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style X - Tapered Crown   Type Connector Probe  Smiths Interconnect Americas, Inc. Type Connector Probe  Spring Test Probes Type Connector Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Type Connector Probe  
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